Stress-induced voiding under vias connected to wide Cu metal leads by Ogawa, E.T., McPherson, J.W., Rosal, J.A., Dickerson, K.J., Chiu, T.-C., Tsung, L.Y., Jain, M.K., Bonifield, T.D., Ondrusek, J.C., McKee, W.R.

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Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs by McKee, W.R., McAdams, H.P., Smith, E.B., McPherson, J.W., Janzen, J.W., Ondrusek, J.C., Hyslop, A.E., Russell, D.E., Coy, R.A., Bergman, D.W., Nguyen, N.Q., Aton, T.J., Block, L.W., Huynh, V.C.

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Genome Sequences of Three Agrobacterium Biovars Help Elucidate the Evolution of Multichromosome Genomes in Bacteria by SLATER, Steven C, GOLDMAN, Barry S, OTTEN, Leon, SUEN, Garret, WELCH, Roy, ALMEIDA, Nalvo F, ARNOLD, Frank, BURTON, Oliver T, ZIJIN DU, EWING, Adam, GODSY, Eric, HEISEL, Sara, GOODNER, Brad, HOUMIEL, Kathryn L, JHAVERI, Jinal, JING LU, MILLER, Nancy M, NORTON, Stacie, QIANG CHEN, PHOOLCHAROEN, Waranyoo, OHLIN, Victoria, ONDRUSEK, Dan, PRIDE, Nicole, SETUBAL, Joao C, STRICKLIN, Shawn L, JIAN SUN, WHEELER, Cathy, WILSON, Lindsey, HUIJUN ZHU, WOOD, Derek W, FARRAND, Stephen K, NESTER, Eugene W, BURR, Thomas J, BANTA, Lois, DICKERMAN, Allan W, PAULSEN, Ian

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