Search Results - Ooms, Eric R.

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  1. 1
    Relation between yield and reliability of integrated circuits and application to failure rate assessment and reduction in the one digit FIT and PPM reliability ERA

    Relation between yield and reliability of integrated circuits and application to failure rate assessment and reduction in the one digit FIT and PPM reliability ERA by Van Der Pol, Jacob A., Kuper, Fred G., Ooms, Eric R.

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  2. 2
    Impact of screening of latent defects at electrical test on the yield-reliability relation and application to burn-in elimination

    Impact of screening of latent defects at electrical test on the yield-reliability relation and application to burn-in elimination by Van der Pol, J.A., Ooms, E.R., Van 't Hof, T., Kuper, F.G.

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  3. 3
    Occurrence and elimination of anomalous temperature dependence of latchup trigger currents in BiCMOS processes

    Occurrence and elimination of anomalous temperature dependence of latchup trigger currents in BiCMOS processes by Ooms, E.R., Van der Pol, J.A.

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  4. 4
    Short loop monitoring of metal stepcoverage by simple electrical measurements

    Short loop monitoring of metal stepcoverage by simple electrical measurements by van der Pol, J.A., Ooms, E.R., Brugman, H.T.

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  5. 5
    Production of Sm-153 With Very High Specific Activity for Targeted Radionuclide Therapy

    Production of Sm-153 With Very High Specific Activity for Targeted Radionuclide Therapy by Van de Voorde, Michiel, Duchemin, Charlotte, Heinke, Reinhard, Lambert, Laura, Chevallay, Eric, Schneider, Thomas, Van Stenis, Miranda, Cocolios, Thomas Elias, Cardinaels, Thomas, Ponsard, Bernard, Ooms, Maarten, Stora, Thierry, Burgoyne, Andrew R.

    Published in Frontiers in medicine
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  6. 6
    Variable heavy chain gene analysis of follicular lymphomas: correlation between heavy chain isotype expression and somatic mutation load

    Variable heavy chain gene analysis of follicular lymphomas: correlation between heavy chain isotype expression and somatic mutation load by Aarts, Wilhelmina M., Bende, Richard J., Steenbergen, Eric J., Kluin, Philip M., Ooms, Engelbert C.M., Pals, Steven T., van Noesel, Carel J.M.

    Published in Blood
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  7. 7
    Relation between yield and reliability of integrated circuits: experimental results and application to continuous early failure rate reduction programs

    Relation between yield and reliability of integrated circuits: experimental results and application to continuous early failure rate reduction programs by Kuper, F., van der Pol, J., Ooms, E., Johnson, T., Wijburg, R., Koster, W., Johnston, D.

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