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Quasi-2-Dimensional Compact Resistor Model for the Drift Region in High-Voltage LDMOS Devices
by
Tanaka, A
,
Oritsuki, Y
,
Kikuchihara, H
,
Miyake, M
,
Mattausch, H J
,
Miura-Mattausch, Mitiko
,
Liu, Y
,
Green, K
Published in
IEEE transactions on electron devices
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Modeling of 2D bias control in overlap region of high-voltage MOSFETs for accurate device/circuit performance prediction
by
Tanaka, A
,
Oritsuki, Y
,
Kikuchihara, H
,
Miyake, M
,
Mattausch, H J
,
Miura-Mattausch, M
,
Liu, Y
,
Green, K
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HiSIM-HV: A Compact Model for Simulation of High-Voltage MOSFET Circuits
by
Oritsuki, Y
,
Yokomichi, M
,
Kajiwara, T
,
Tanaka, A
,
Sadachika, N
,
Miyake, M
,
Kikuchihara, H
,
Johguchi, K
,
Feldmann, U
,
Mattausch, H J
,
Miura-Mattausch, M
Published in
IEEE transactions on electron devices
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HiSIM-HV: A compact model for simulation of high-voltage-MOSFET circuits
by
Mattausch, H.J.
,
Kajiwara, T.
,
Yokomichi, M.
,
Sakuda, T.
,
Oritsuki, Y.
,
Miyake, M.
,
Sadachika, N.
,
Kikuchihara, H.
,
Feldmann, U.
,
Miura-Mattausch, M.
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Effect of Impact-Ionization-Generated Holes on the Breakdown Mechanism in LDMOS Devices
by
Sakuda, T.
,
Sadachika, N.
,
Oritsuki, Y.
,
Yokomichi, M.
,
Miyake, M.
,
Kajiwara, T.
,
Kikuchihara, H.
,
Feldmann, U.
,
Mattausch, H.J.
,
Miura-Mattausch, M.
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Threshold voltage shift of amorphous silicon thin-film transistors during pulse operation
by
ORITSUKI, R
,
HORII, T
,
SASANO, A
,
TSUTSUI, K
,
KOIZUMI, T
,
KANEKO, Y
,
TSUKADA, T
Published in
Japanese Journal of Applied Physics
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