Search Results - Orozco-Hernández, H.D.

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    Nanostructure characterization in single and multi layer yttria stabilized zirconia films using XPS, SEM, EDS and AFM

    Nanostructure characterization in single and multi layer yttria stabilized zirconia films using XPS, SEM, EDS and AFM by Espitia-Cabrera, I., Orozco-Hernández, H.D., Bartolo-Pérez, P., Contreras-García, M.E.

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