Search Results - Otero-Carrascal, Alan Y.

  • Showing 1 - 2 results of 2
Refine Results
  1. 1
    Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique

    Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique by Otero-Carrascal, Alan Y., Chaparro-Ortiz, Dora A., Gutierrez-D, Edmundo A., Torres-Torres, Reydezel, Huerta-Gonzalez, Oscar, Srinivasan, P.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  2. 2
    Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET

    Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET by Chaparro-Ortiz, Dora A., Otero-Carrascal, Alan Y., Gutierrez-D., Edmundo A., Torres-Torres, Reydezel, Huerta-Gonzalez, Oscar, Srinivasan, P., Guarin, Fernando

    Request full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: