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Search Results - Otiaba, K. C.
Search Results - Otiaba, K. C.
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Thermal interface materials for automotive electronic control unit: Trends, technology and R&D challenges
by
Otiaba, K.C.
,
Ekere, N.N.
,
Bhatti, R.S.
,
Mallik, S.
,
Alam, M.O.
,
Amalu, E.H.
Published in
Microelectronics and reliability
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A study of SnAgCu solder paste transfer efficiency and effects of optimal reflow profile on solder deposits
by
Amalu, E.H.
,
Lau, W.K.
,
Ekere, N.N.
,
Bhatti, R.S.
,
Mallik, S.
,
Otiaba, K.C.
,
Takyi, G.
Published in
Microelectronic engineering
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Thermal effects of die-attach voids location and style on performance of chip level package
by
Otiaba, K. C.
,
Bhatti, R. S.
,
Ekere, N. N.
,
Mallik, S.
,
Amalu, E. H.
,
Ekpu, M.
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Emerging nanotechnology-based thermal interface materials for automotive electronic control unit application
by
Otiaba, K. C.
,
Ekere, N. N.
,
Bhatti, R. S.
,
Mallik, S.
,
Amalu, E. H.
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Comparative study of the effects of coalesced and distributed solder die attach voids on thermal resistance of packaged semiconductor device
by
Otiaba, K. C.
,
Bhatti, R. S.
,
Ekere, N. N.
,
Ekpu, M.
,
Adeyemi, J.
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Conference Proceeding
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Microelectronic Engineering
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Microelectronics And Reliability
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Microelectronics Reliability
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Thermal Resistance
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Applied Sciences
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Design. Technologies. Operation Analysis. Testing
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Electronic Equipment And Fabrication. Passive Components, Printed Wiring Boards, Connectics
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Electronic Packaging Thermal Management
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Solder Die Attach
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Ieee Electronic Library (Iel) Conference Proceedings
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Sciencedirect Additional Titles
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Sciencedirect Freedom Collection 2022-2024
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Elsevier Sd Backfile Engineering And Technology
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Ieee Xplore All Conference Series
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Backfile Package - Computer Science (Legacy) [Ycs]
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