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Search Results - Ouduangvilai, Konepachith
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Study of Gate Leakage Current on AlGaN/GaN MOSHEMTs with Atomic Layer Deposited Al₂O₃ Gate Oxide
by
Ouduangvilai, Konepachith
,
Lee, Hoon-Ki
,
Janardhanam, Vallivedu
,
Reddy, P. R. Shekar
,
Choi, Chel-Jong
,
Shim, Kyu-Hwan
Published in
Journal of semiconductor technology and science
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Study of Gate Leakage Current on AlGaN/GaN MOS-HEMTs with Atomic Layer Deposited Al2O3 Gate Oxide
by
Konepachith Ouduangvilai
,
Hoon-Ki Lee
,
Vallivedu Janardhanam
,
P. R. Shekar Reddy
,
Chel-Jong Choi
,
Kyu-Hwan Shim
Published in
Journal of semiconductor technology and science
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Journal Of Semiconductor Technology And Science
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Subjects
Algan/Gan Hemt
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Engineering
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Engineering, Electrical & Electronic
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Gate Leakage Mechanisms
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Mos Diode
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Physical Sciences
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Physics
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Physics, Applied
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Poole-Frenkel Emission
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Schottky Emission Mechanism
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Science & Technology
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Technology
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전기공학
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Freely Accessible Journals
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Full-Text Journals In Chemistry (Open Access)
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Ezb Electronic Journals Library
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Science Citation Index Expanded (Web Of Science)
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