Search Results - Oyobe, Teppei

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    Surface sensitivity of atomic resolution secondary electron imaging

    Surface sensitivity of atomic resolution secondary electron imaging by Saitoh, Koh, Oyobe, Teppei, Igarashi, Keisuke, Sato, Takeshi, Matsumoto, Hiroaki, Inada, Hiromi, Endo, Takahiko, Miyata, Yasumitsu, Usami, Rei, Takenobu, Taishi

    Published in Microscopy
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