Search Results - P. Fukarek

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  1. 1
    Entwurf einer Vegetationskarte Jugoslawiens im Masstab 1 : 1 000 000

    Entwurf einer Vegetationskarte Jugoslawiens im Masstab 1 : 1 000 000 by Fukarek, P

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  2. 2
    1. Internationale Kolloquium uber die geplante Vegetationskarte Europas

    1. Internationale Kolloquium uber die geplante Vegetationskarte Europas by Ozenda, P., W. Trautmann, Bohn, U., Lavrenko, E. M., T. I. Isačenko, S. A. Gribova, W. Matuszkiewicz, R. Lakušić, Neuhäusl, R., G. Hofmann, Scamoni, A., N. Doniţa, P. Fukarek, I. A. Bondev, Fekete, G., Moravec, J., J. Michalko

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  3. 3
    Anisotropic deformation of colloidal particles under MeV ion irradiation

    Anisotropic deformation of colloidal particles under MeV ion irradiation by van Dillen, T, Snoeks, E, Fukarek, W, van Kats, C.M, Velikov, K.P, van Blaaderen, A, Polman, A

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  4. 4
    Depth profiles of Argon incorporated into Boron Nitride films during preparation and their temperature dependent evolution

    Depth profiles of Argon incorporated into Boron Nitride films during preparation and their temperature dependent evolution by Deyneka, N., Zhang, X.W., Boyen, H.-G., Ziemann, P., Fukarek, W., Kruse, O., Möller, W.

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  5. 5
    In situ characterization of cubic boron nitride film growth in the IR spectral region

    In situ characterization of cubic boron nitride film growth in the IR spectral region by Barth, K.-L, Fukarek, W, Maucher, H.-P, Plass, M.F, Lunk, A

    Published in Thin solid films
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  6. 6
    Modelling high-temperature co-implantation of N + and Al + ions in silicon carbide: the effect of stress on the implant and damage distributions

    Modelling high-temperature co-implantation of N + and Al + ions in silicon carbide: the effect of stress on the implant and damage distributions by Rybin, P.V., Kulikov, D.V., Trushin, Yu.V., Yankov, R.A., Ecke, G., Fukarek, W., Skorupa, W., Pezoldt, J.

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  7. 7
    Surface electronic states of adsorbed nitrogen molecules on oxidized nickel surface

    Surface electronic states of adsorbed nitrogen molecules on oxidized nickel surface by OBARA, K, YIJI, P, CHIBA, K.-I, FUKAREK, W, MÖLLER, W

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  8. 8
    Electrical and optical characterisation of double SIMOX structures formed by sequential high energy oxygen implantation into silicon

    Electrical and optical characterisation of double SIMOX structures formed by sequential high energy oxygen implantation into silicon by Hatzopoulos, N., Panknin, D., Fukarek, W., Skorupa, W., Siapkas, D.I., Hemment, P.L.F.

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  9. 9
    In situ characterization of cubic boron nitride film growth in the IR spectral region

    In situ characterization of cubic boron nitride film growth in the IR spectral region by BARTH, K.-L, FUKAREK, W, MAUCHER, H.-P, PLASS, M. F, LUNK, A

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  10. 10
    Range and damage distributions in ultra-low energy boron implantation into silicon

    Range and damage distributions in ultra-low energy boron implantation into silicon by Hatzopoulos, N., Suder, S., van den Berg, J.A., Donnelly, S.E., Cook, C.E.A., Armour, D.G., Panknin, D., Fukarek, W., Lucassen, M., Frey, L., Foad, M.A., England, J.G., Moffatt, S., Bailey, P., Noakes, C.T., Ohno, H.

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