Bipolar Corona Discharge-Based Charge Equilibration for Nano Electrospray Gas-Phase Electrophoretic Mobility Molecular Analysis of Bio- and Polymer Nanoparticles by Weiss, Victor U, Frank, Johannes, Piplits, Kurt, Szymanski, Wladyslaw W, Allmaier, Günter

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Accurate determination of trace amounts of oxygen in CrAlN hard coatings by a combination of WDS-EPMA and SIMS by DREER, Sabine, WILHARTITZ, Peter, SARTORY, Bernhard, TESSADRI, Richard, PIPLITS, Kurt, MAYERHOFER, Karl Emanuel

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Quantitative SIMS depth profiling of diffusion barrier gate-oxynitride structures in TFT-LCDs by Dreer, Sabine, Wilhartitz, Peter, Piplits, Kurt, Mayerhofer, Karl, Foisner, Johann, Hutter, Herbert

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Investigations on the Thermal Cycling Stability of SiFeCr Coated NbtZr by Gritsch, Martin, Piplits, Kurt, Barbist, Roland, Wilhartitz, Peter, Hutter, Herbert

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Characterization of the element distribution within TiN coatings with SIMS by KOLBER, Thomas, PIPLITS, Kurt, PALMETSHOFER, Leopold, HUTTER, Herbert

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Quantitative analysis of thin aluminium-oxynitride films by EPMA by DREER, S, WILHARTITZ, P, MERSDORF, E, PIPLITS, K, FRIEDBACHER, G

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Investigations on the thermal cycling stability of SiFeCr coated NbWZr by GRITSCH, M, PIPLITS, K, BARBIST, R, WILHARTITZ, P, HUTTER, H

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Quantitative sputter depth profiling of silicon- and aluminium oxynitride films by DREER, S, WILHARTITZ, P, PIPLITS, K, HUTTER, H, KOPNARSKI, M, FRIEDBACHER, G

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Comparison of depth profiles in SIMS by a fuzzy method by OTTO, M, STINGEDER, G, PIPLITS, K, GRASSERBAUER, M, HEINRICH, M

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Simultaneous quantitative determination of the distribution of dopants in silicon by high mass resolution secondary ion mass spectrometry by Stingeder, Gerhard, Piplits, Kurt, Gara, Stefan, Grasserbauer, Manfred, Budil, Matthias, Poetzl, Hans

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