Search Results - PRIDACHIN, D. N

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  1. 1
    Ellipsometric study of tellurium molecular beam interaction with dehydrogenated vicinal silicon surfaces

    Ellipsometric study of tellurium molecular beam interaction with dehydrogenated vicinal silicon surfaces by Shvets, V.A, Chikichev, S.I, Pridachin, D.N, Yakushev, M.V, Sidorov, Yu.G, Mardezhov, A.S

    Published in Thin solid films
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  2. 2
    The heteroepitaxy of II–VI compounds on the non-isovalent substrates (ZnTe/Si)

    The heteroepitaxy of II–VI compounds on the non-isovalent substrates (ZnTe/Si) by Sidorov, Yu.G, Yakushev, M.V, Pridachin, D.N, Varavin, V.S, Burdina, L.D

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  3. 3
    A study of tellurium adsorption processes on silicon by ellipsometry, RHEED and AES methods

    A study of tellurium adsorption processes on silicon by ellipsometry, RHEED and AES methods by Pridachin, D.N., Yakushev, M.V., Sidorov, Yu.G., Shvets, V.A.

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  4. 4
    The heteroepitaxy of II-VI compounds on the non-isovalent substrates (ZnTe/Si)

    The heteroepitaxy of II-VI compounds on the non-isovalent substrates (ZnTe/Si) by SIDOROV, Yu. G, YAKUSHEV, M. V, PRIDACHIN, D. N, VARAVIN, V. S, BURDINA, L. D

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  5. 5
    A study of tellurium adsorption processes on silicon by ellipsometry, RHEED and AES methods

    A study of tellurium adsorption processes on silicon by ellipsometry, RHEED and AES methods by PRIDACHIN, D. N, YAKUSHEV, M. V, SIDOROV, Yu. G, SHVETS, V. A

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  6. 6
    Ellipsometric study of tellurium molecular beam interaction with dehydrogenated vicinal silicon surfaces

    Ellipsometric study of tellurium molecular beam interaction with dehydrogenated vicinal silicon surfaces by SHVETS, V. A, CHIKICHEV, S. I, PRIDACHIN, D. N, YAKUSHEV, M. V, SIDOROV, Yu. G, MARDEZHOV, A. S

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