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Atomic force microscopy of partially polished and epi-ready c-plane GaN substrates obtained by an ammonothermal method
by
Serafinczuk, Jaros aw
,
Jó wiak, Grzegorz
,
Pa etko, Piotr
,
Kudrawiec, Robert
,
Kucharski, Robert
,
Zajac, Marcin
,
Gotszalk, Teodor Pawe
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Applied physics express
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