Temperature and time dependence of B and P diffusion in Si during surface oxidation by PACKAN, P. A, PLUMMER, J. D

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Linear versus saturated drive current: tradeoffs in super steep retrograde well engineering by Thompson, S E, Packan, P A, Bohr, M T

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Doping and damage dose dependence of implant induced transient enhanced diffusion below the amorphization threshold by Griffin, P. B., Lever, R. F., Packan, P. A., Plummer, J. D.

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Transient diffusion of low-concentration B in Si due to 29Si implantation damage by PACKAN, P. A, PLUMMER, J. D

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Scaling Transistors into the Deep-Submicron Regime by Packan, Paul A.

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Species, dose and energy dependence of implant induced transient enhanced diffusion by Griffin, P.B., Lever, R.F., Huang, R.Y.S., Kennel, H.W., Packan, P.A., Plummer, J.D.

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Simulation of transient enhanced diffusion using computationally efficient models by Yu, S.S., Kennel, H.W., Giles, M.D., Packan, P.A.

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Implantationdamage and transient enhanced diffusion modeling by GILES, M. D, SHAOFENG YU, KENNEL, H. W, PACKAN, P. A

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Ion thrusters for electric propulsion: Scientific issues developing a niche technology into a game changer by Holste, K., Dietz, P., Scharmann, S., Keil, K., Henning, T., Zschätzsch, D., Reitemeyer, M., Nauschütt, B., Kiefer, F., Kunze, F., Zorn, J., Heiliger, C., Joshi, N., Probst, U., Thüringer, R., Volkmar, C., Packan, D., Peterschmitt, S., Brinkmann, K. -T., Zaunick, H.-G., Thoma, M. H., Kretschmer, M., Leiter, H. J., Schippers, S., Hannemann, K., Klar, P. J.

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Electron dynamics and ion acceleration in expanding-plasma thrusters by Lafleur, T, Cannat, F, Jarrige, J, Elias, P Q, Packan, D

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Optimization of a coaxial electron cyclotron resonance plasma thruster with an analytical model by Cannat, F., Lafleur, T., Jarrige, J., Chabert, P., Elias, P.-Q., Packan, D.

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3D ion velocity distribution function measurement in an electric thruster using laser induced fluorescence tomography by Elias, P. Q., Jarrige, J., Cucchetti, E., Cannat, F., Packan, D.

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Thrust Measurements of the Gaia Mission Flight-Model Cold Gas Thrusters by Jarrige, J, Thobois, P, Blanchard, C, Elias, P.-Q, Packan, D, Fallerini, L, Noci, G

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Numerical modeling of a glow discharge through a supersonic bow shock in air by Rassou, S., Packan, D., Elias, P.-Q., Tholin, F., Chemartin, L., Labaune, J.

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Effect of nanosecond pulsed electric field on Escherichia coli in water: inactivation and impact on protein changes by Guionet, A, Joubert‐Durigneux, V, Packan, D, Cheype, C, Garnier, J.‐P, David, F, Zaepffel, C, Leroux, R.‐M, Teissié, J, Blanckaert, V

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Numerical modelling of the properties of an ion beam extracted from a low-pressure wire discharge by Gueroult, R, Elias, P Q, Packan, D, Rax, J M

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Transistor aging and reliability in 14nm tri-gate technology by Novak, S., Parker, C., Becher, D., Liu, M., Agostinelli, M., Chahal, M., Packan, P., Nayak, P., Ramey, S., Natarajan, S.

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Analytical Modeling of Output Conductance in Long-Channel Halo-Doped MOSFETs by Mudanai, S., Wei-Kai Shih, Rios, R., Xuemei Xi, Jung-Hoon Rhew, Kuhn, K., Packan, P.

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Particle in cell modelling of the observed modes of a dc wire discharge by Gueroult, R, Elias, P Q, Packan, D, Bonnet, J, Rax, J M

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Self-heat reliability considerations on Intel's 22nm Tri-Gate technology by Prasad, C., Jiang, L., Singh, D., Agostinelli, M., Auth, C., Bai, P., Eiles, T., Hicks, J., Jan, C. H., Mistry, K., Natarajan, S., Niu, B., Packan, P., Pantuso, D., Post, I., Ramey, S., Schmitz, A., Sell, B., Suthram, S., Thomas, J., Tsai, C., Vandervoorn, P.

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