Characterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques by Miller, Mary A., Tangyunyong, Paiboon, Cole, Edward I.

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Characterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques by Miller, Mary A., Tangyunyong, Paiboon, Cole, Edward I.

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Identification of radiation-induced parasitic leakage paths using light emission microscopy by Shaneyfelt, M.R., Paiboon Tangyunyong, Hill, T.A., Soden, J.M., Flores, R.S., Schwank, J.R., Dodd, P.E., Hash, G.L.

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Diagnosis of factors impacting yield in multilayer devices for superconducting electronics by Missert, Nancy A., Jenkins, Mark W., Tangyunyong, Paiboon, Mook, William, Vernik, I., Kirichenko, A., Mukhanov, O., Wynn, A., Day, A. L., Bolkhovsky, V., Johnson, L.

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Thermal modeling of localized laser heating in multi-level interconnects by Tangyunyong, Paiboon

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Failure Analysis Techniques for Microsystems-Enabled Photovoltaics by Yang, Benjamin B., Cruz-Campa, Jose L., Haase, Gaddi S., Cole, Edward I., Tangyunyong, Paiboon, Resnick, Paul J., Kilgo, Alice C., Okandan, Murat, Nielson, Gregory N.

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Stress factor assessment for microsystems-enabled photovoltaics by Yang, Benjamin B., Cruz-Campa, Jose L., Haase, Gaddi S., Tangyunyong, Paiboon, Okandan, Murat, Nielson, Gregory N.

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Fault localization and failure modes in microsystems-enabled photovoltaic devices by Yang, B. B., Cruz-Campa, J. L., Haase, G. S., Tangyunyong, P., Cole, Edward I., Pimentel, A. A., Resnick, P. J., Okandan, M., Nielson, G. N.

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Thermal Modeling of TIVA Profiles of a Polysilcon-Metal Test Structure by Benson, D.A., Cole, E.I. Jr, Tangyunyong, Paiboon

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Thermal modeling of a polysilicon-metal test structure used for thermally induced voltage alteration characterization by Tangyunyong, Paiboon, Benson, David, Cole, Edward I.

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Various Applications of Power Spectrum Analysis (PSA) by Tangyunyong,Paiboon, Udoni,Darlene M, Loubriel,Guillermo M

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Frequency dependence of the lifetime of a surface micromachined microengine driving a load by Tanner, Danelle M, Miller, William M, Peterson, Ken A, Dugger, Michael T, Eaton, William P, Irwin, Lloyd W, Senft, Donna C, Smith, Norman F, Tangyunyong, Paiboon, Miller, Samuel L

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Local thermal probing to detect open and shorted IC interconnections by Cole, Edward I., Tangyunyong, Paiboon, Barton, Daniel L.

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Transient power supply voltage (V/sub DDT/) analysis for detecting IC defects by Cole, E.I., Soden, J.M., Tangyunyong, P., Candelaria, P.L., Beegle, R.W., Barton, D.L., Henderson, C.L., Hawkins, C.F.

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Backside localization of open and shorted IC interconnections by Cole, E.I. Jr, Tangyunyong, P., Barton, D.L.

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The effect of frequency on the lifetime of a surface micromachined microengine driving a load by Tanner, D.M., Miller, W.M., Eaton, W.P., Irwin, L.W., Peterson, K.A., Dugger, M.T., Senft, D.C., Smith, N.F., Tangyunyong, P., Miller, S.L.

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Identification of radiation-induced parasitic leakage paths using light emission microscopy by Shaneyfelt, M.R., Tangyunyong, P., Hill, T.A., Soden, J.M., Flores, R.S., Schwank, J.R., Dodd, P.E., Hash, G.L.

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