Search Results - Palchun, Yu. A.
-
1
-
2
-
3
-
4
-
5
-
6
-
7
-
8
-
9
-
10
-
11
System models of metrological support and manufacturing control
Conference Proceeding -
12
-
13
-
14
-
15
-
16
Applying S-graphs for modeling metrological support and control systems
Conference Proceeding -
17
-
18
-
19
The generalized analysis of parameters measurement of processes in QMS
Conference Proceeding -
20
Generalized analysis of processes parameters measurement in SQM
Conference Proceeding