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Search Results - Pangrle, Suzette Keefe
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In-process detection of microscratching during CMP using acoustic emission sensing technology
by
Tang, Jianshe
,
Dornfeld, David
,
Pangrle, Suzette Keefe
,
Dangca, Alvin
Published in
Journal of electronic materials
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Journal Of Electronic Materials
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Acoustic
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Chemical Mechanical Planarization
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Emission
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Engineering
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Engineering, Electrical & Electronic
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Materials Science
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Materials Science, Multidisciplinary
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Microscratch
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