Search Results - Paradis, D.E.

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  1. 1
    Automation of wafer handling in legacy semiconductor fab-a true cultural change

    Automation of wafer handling in legacy semiconductor fab-a true cultural change by Guldi, R.L., Whitfield, M.T., Paradis, D.E., Poag, F.D., Jensen, D.P.

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  2. 2
    Strategy and metrics for wafer handling automation in legacy semiconductor fab

    Strategy and metrics for wafer handling automation in legacy semiconductor fab by Guldi, R.L., Paradis, D.E., Whitfield, M.T., Poag, F.D., Jensen, D.P.

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    A multi-pronged approach to defect management

    A multi-pronged approach to defect management by Paradis, D.E., Guldi, R.L., Lalena, J.N., Ritchison, J.W.

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    Conference Proceeding
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    Prognostic value of high c-Met expression in patients with poor prognosis pancreatic adenocarcinoma (PAC) following surgical resection: comparison of three c-Met scoring methods and exploration of underlying mechanisms of c-Met overexpression

    Prognostic value of high c-Met expression in patients with poor prognosis pancreatic adenocarcinoma (PAC) following surgical resection: comparison of three c-Met scoring methods an... by Neuzillet, Cindy, Tijeras-Raballand, Annemilaï, Raffenne, Jérôme, Gramont, Armand D.E, Bedossa, Pierre, Paradis, Valérie, Sauvanet, Alain, Bachet, Jean-Baptiste, Raymond, Eric, Hammel, Pascal, Couvelard, Anne, Cros, Jérôme

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