Search Results - Parjadis, G.

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  1. 1
    Estimate of the degree of inhomogeneity of the refractive index of dielectric films from spectroscopic ellipsometry

    Estimate of the degree of inhomogeneity of the refractive index of dielectric films from spectroscopic ellipsometry by Larivière, G P, Frigerio, J M, Rivory, J, Abelès, F

    Published in Applied optics (2004)
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  2. 2
    Enhancement and quenching of Berreman polaritons in SiO2/TiO2 and Al2O3/Pt superlattices

    Enhancement and quenching of Berreman polaritons in SiO2/TiO2 and Al2O3/Pt superlattices by Wold, E., Bremer, J., Hunderi, O., Frigerio, J. M., Parjadis, G., Rivory, J.

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  3. 3
    Modelling of ellipsometric data of inhomogeneous TiO2 films

    Modelling of ellipsometric data of inhomogeneous TiO2 films by Parjadis de Lariviére, G., Frigerio, J.M., Bridou, F., Rivory, J.

    Published in Thin solid films
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  4. 4
    Modelling of ellipsometric data of inhomogeneous TiO sub(2) films

    Modelling of ellipsometric data of inhomogeneous TiO sub(2) films by de Lariviere, G Parjadis, Frigerio, J M, Bridou, F, Rivory, J

    Published in Thin solid films
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  5. 5
    Modeling of ellipsometric data of inhomogeneous TiO sub 2 films

    Modeling of ellipsometric data of inhomogeneous TiO sub 2 films by Parjadis de Lariviere, G, Frigerio, J M, Bridou, F, Rivory, J

    Published in Thin solid films
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