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Search Results - Park, Kyosun
Search Results - Park, Kyosun
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Effect of the martensite distribution on the strain hardening and ductile fracture behaviors in dual-phase steel
by
Park, Kyosun
,
Nishiyama, Masato
,
Nakada, Nobuo
,
Tsuchiyama, Toshihiro
,
Takaki, Setsuo
Published in
Materials science & engineering. A, Structural materials : properties, microstructure and processing
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Heat stress response of male germ cells
by
Kim, Byunghyuk
,
Park, Kyosun
,
Rhee, Kunsoo
Published in
Cellular and molecular life sciences : CMLS
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Importance of eIF2α phosphorylation as a protective mechanism against heat stress in mouse male germ cells
by
Yoon, Jungbin
,
Park, Kyosun
,
Hwang, Deog Su
,
Rhee, Kunsoo
Published in
Molecular reproduction and development
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Influence of Surface Segregation of Tin on the Phosphatability of Cold‐Rolled Steel Sheets
by
Park, Joongchul
,
Kim, Dong‐Hyun
,
Lee, Seunghwan
,
Yoo, Hyeonseok
,
Park, Kyosun
,
Cho, Jaedong
Published in
Steel research international
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Importance of eIF2[alpha] phosphorylation as a protective mechanism against heat stress in mouse male germ cells
by
Yoon, Jungbin
,
Park, Kyosun
,
Hwang, Deog Su
,
Rhee, Kunsoo
Published in
Molecular reproduction and development
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Dual phase structure formed by partial reversion of cold-deformed martensite
by
Nakada, Nobuo
,
Arakawa, Yusuke
,
Park, Kyo-Son
,
Tsuchiyama, Toshihiro
,
Takaki, Setsuo
Published in
Materials science & engineering. A, Structural materials : properties, microstructure and processing
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Comparison of hot carrier-induced RF performance degradation in H-gate and T-gate SOI MOSFETs
by
LEE, Byung-Jin
,
PARK, Jang-Woo
,
KIM, Kyosun
,
YU, Chong-Gun
,
PARK, Jong-Tae
Published in
IEEE electron device letters
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Effects of gate structures on the RF performance in PD SOI MOSFETs
by
LEE, Byung-Jin
,
KIM, Kyosun
,
YU, Chong-Gun
,
LEE, Jong-Ho
,
PARK, Jong-Tae
Published in
IEEE microwave and wireless components letters
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Influence of salinity on metal toxicity to Ulva pertusa
by
Oh, Jeong-ju
,
Choi, Eun-Mi
,
Han, Young-Seok
,
Yoon, Jeong-Hyun
,
Park, Areum
,
Jin, Kyosun
,
Lee, Ju-Wook
,
Choi, Hoon
,
Kim, Sunjin
,
Brown, Murray T.
,
Han, Taejun
Published in
Toxicology and environmental health sciences
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Reliability improvement by the suppression of keyhole generation in W-plug vias
by
Kim, Jong Hun
,
Kim, Kyosun
,
Jeon, Seok Hee
,
Park, Jong Tae
Published in
Microelectronics and reliability
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Effects of hot carrier stress on the RF performance in SOI MOSFETs
by
LEE, Byung-Jin
,
KIM, Kyosun
,
PARK, Jong-Tae
Published in
Microelectronics and reliability
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