Search Results - Parrassin, Thierry

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    Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation

    Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation by PARRASSIN, Thierry, CELI, Guillaume, DUDIT, Sylvain, VALLET, Michel

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  2. 2
    Failure analysis defect location on a real case 55nm memory using dynamic power supply emulation

    Failure analysis defect location on a real case 55nm memory using dynamic power supply emulation by Parrassin, Thierry, Celi, Guillaume, Dudit, Sylvain, Vallet, Michel

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  3. 3
    Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below)

    Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below) by Celi, Guillaume, Dudit, Sylvain, Perdu, Philippe, Reverdy, Antoine, Parrassin, Thierry, Bechet, Emmanuel, Lewis, Dean, Vallet, Michel

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  4. 4
    Altitude SEE Test European Platform (ASTEP) and First Results in CMOS 130 nm SRAM

    Altitude SEE Test European Platform (ASTEP) and First Results in CMOS 130 nm SRAM by Autran, J-L., Roche, P., Borel, J., Sudre, C., Castellani-Coulie, K., Munteanu, D., Parrassin, T., Gasiot, G., Schoellkopf, J-P.

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  5. 5
    LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis

    LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis by Celi, Guillaume, Dudit, Sylvain, Parrassin, Thierry, Perdu, Philippe, Reverdy, Antoine, Lewis, Dean, Vallet, Michel

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