Search Results - Passicousset, J.

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    Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions

    Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions by Barrett, N., Gottlob, D. M., Mathieu, C., Lubin, C., Passicousset, J., Renault, O., Martinez, E.

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