Search Results - Pavera, Michal

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    The novel approach to correlative microscopy using AFM-in-SEM and CPEM technology

    The novel approach to correlative microscopy using AFM-in-SEM and CPEM technology by Hegrova, Veronika, Horak, Josef, Novacek, Zdenek, Pavera, Michal, Neuman, Jan

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    Correlative Probe and Electron Microscopy CPEM™ – The Novel Technology for 3D Material Surface Analysis

    Correlative Probe and Electron Microscopy CPEM™ – The Novel Technology for 3D Material Surface Analysis by Neuman, Jan, Novacek, Zdenek, Pavera, Michal, Novotna, Veronika

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    Multidimensional Sample Surface Analysis by AFM-in-SEM

    Multidimensional Sample Surface Analysis by AFM-in-SEM by Novotna, Veronika, Hegrova, Veronika, Horak, Josef, Novacek, Zdenek, Pavera, Michal, Neuman, Jan

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