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Search Results - Pease, G.L.
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Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation
by
Pease, R.L.
,
Sternberg, A.L.
,
Boulghassoul, Y.
,
Massengill, L.W.
,
Buchner, S.
,
McMorrow, D.
,
Walsh, D.S.
,
Hash, G.L.
,
LaLumondiere, S.D.
,
Moss, S.C.
Published in
IEEE transactions on nuclear science
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Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs
by
Shaneyfelt, M.R.
,
Schwank, J.R.
,
Witczak, S.C.
,
Fleetwood, D.M.
,
Pease, R.L.
,
Winokur, P.S.
,
Riewe, L.C.
,
Hash, G.L.
Published in
IEEE transactions on nuclear science
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Impact of passivation layers on enhanced low-dose-rate sensitivity and pre-irradiation elevated-temperature stress effects in bipolar linear ICs
by
Shaneyfelt, M.R.
,
Pease, R.L.
,
Schwank, J.R.
,
Maher, M.C.
,
Hash, G.L.
,
Fleetwood, D.M.
,
Dodd, P.E.
,
Reber, C.A.
,
Witczak, S.C.
,
Riewe, L.C.
,
Hjalmarson, H.P.
,
Banks, J.C.
,
Doyle, B.L.
,
Knapp, J.A.
Published in
IEEE transactions on nuclear science
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Impact of aging on radiation hardness[CMOS SRAMs]
by
Shaneyfelt, M.R.
,
Winokur, P.S.
,
Fleetwood, D.M.
,
Hash, G.L.
,
Schwank, J.R.
,
Sexton, F.W.
,
Pease, R.L.
Published in
IEEE transactions on nuclear science
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Peer Reviewed
4 results
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Format
Articles
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Journal Title
Ieee Transactions On Nuclear Science
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4
Subjects
Engineering
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Engineering, Electrical & Electronic
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4
Nuclear Science & Technology
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4
Science & Technology
4 results
4
Technology
4 results
4
Thermal Stresses
3 results
3
Circuits
2 results
2
Cmos Technology
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2
Hardness
2 results
2
Laboratories
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2
Positron Emission Tomography
2 results
2
Radiation Effects
2 results
2
Stresses
2 results
2
Voltage
2 results
2
Aging
1 results
1
Annealing
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1
Beams
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Bipolar Analog
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1
Bipolar Integrated Circuits
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Bipolar Linear-Integrated Circuits
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Year of Publication
From:
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1400 : 2025
1400
2025
Source
Ieee Xplore (Online Service)
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Ieee Xplore All Journals
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