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Evaluation of neon focused ion beam milling for TEM sample preparation
by
PEKIN, T.C.
,
ALLEN, F.I.
,
MINOR, A.M.
Published in
Journal of microscopy (Oxford)
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Towards Ptychography with Structured Illumination, and a Derivative-Based Reconstruction Algorithm
by
Van den Broek, W.
,
Schloz, M.
,
Pekin, T.C.
,
Pelz, P.M.
,
Lu, P.-H.
,
Kruth, M.
,
Grillo, V.
,
Dunin-Borkowski, R.E.
,
Miller, R.J.D.
,
Koch, C.T.
Published in
Microscopy and microanalysis
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Journal Of Microscopy
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Microscopy And Microanalysis
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Advances In Phase Retrieval Microscopy
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Algorithms
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Analytical And Instrumentation Science Symposia
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Fib
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Gfis
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Ion Beams
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Ion Milling
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Lmis
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Microscopy
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Sample Preparation
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Science & Technology
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Technology
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Tem
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Transmission Electron Microscopy
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