Blind estimation of DED camera gain in Electron Microscopy by Sorzano, C.O.S., Fernández-Giménez, E., Peredo-Robinson, V., Vargas, J., Majtner, T., Caffarena, G., Otón, J., Vilas, J.L., de la Rosa-Trevín, J.M., Melero, R., Gómez-Blanco, J., Cuenca, J., del Cano, L., Conesa, P., Marabini, R., Carazo, J.M.

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