89 GHz zero-bias Schottky detector for direct detection radiometry in European satellite programme MetOp-SG by Hoefle, M, Penirschke, A, Cojocari, O, Decoopman, T, Trier, M, Piironen, P, Périchaud, M.G, Jakoby, R

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GaAs P-HEMT MMIC processes behavior under multiple heavy ion radiation stress conditions combined with DC and RF biasing by Bensoussan, A., Marec, R., Muraro, J.L., Portal, L., Calvel, P., Barillot, C., Perichaud, M.G., Marchand, L., Vignon, G.

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The use of impedance spectroscopy, SEM and SAM imaging for early detection of failure in SMT assemblies by Ousten, Y., Mejdi, S., Fenech, A., Deletage, J.Y., Bechou, L., Perichaud, M.G., Danto, Y.

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1/f noise in conductive adhesive bonds under mechanical stress as a sensitive and fast diagnostic tool for reliability assessment by Vandamme, L K J, Perichaud, M G, Noguera, E, Danto, Y, Behner, U

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Reliability evaluation of adhesive bonded SMT components in industrial applications by Périchaud, M.G., Delétage, J.Y., Frémont, H., Danto, Y., Faure, C.

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Specific Characterization for Destructive Single Event Effects on GaAs Power P-HEMT MMIC by Marec, R., Bensoussan, A., Muraro, J. L., Portal, L., Calvel, P., Barillot, C., Perichaud, M. G., Marchand, L., Vignon, G.

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1/f noise as a diagnostic tool to investigate the quality of isotropic conductive adhesive bonds by Vandamme, L.K.J., Perichaud, M.G., Noguera, E., Danto, Y., Behner, U.

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A Manufacturable True E-Mode MHEMT with High Static and Dynamic Performances by Maher, H., Baudet, P., El Makoudi, I., Perichaud, M.-G., Bellaiche, J., Renvoise, M., Rouchy, U., Frijlink, P.

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Millimeter & sub-millimeter wave radiometer instruments for the next generation of polar orbiting meteorological satellites - MetOp-SG by Thomas, B., Brandt, M., Walber, A., Gibson, H., Philipp, M., Sonnabend, G., Benzazaa, M., Gonzalez, R., Bergada, M., Martinez, J., Perichaud, M. G., Narhi, T., Klein, U., d'Addio, S., Kangas, V.

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Thermomechanical behaviour of adhesive jointed SMT components by Perichaud, M.G., Deletage, J.Y., Carboni, D., Fremont, H., Danto, Y., Faure, C.

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Evaluation of conductive adhesives for industrial SMT assemblies by Perichaud, M.G., Deletage, J.Y., Fremont, H., Danto, Y., Faure, C., Salagoity, M.

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The use of impedance spectroscopy, SEM and SAM imaging for early detection of failure in SMT assemblies by Ousten, Y., Mejdi, S., Fenech, A., Deletage, J.Y., Bechou, L., Perichaud, M.G., Danto, Y.

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Growth undercooling in multi-crystalline pure silicon and in silicon containing light impurities (C and O) by Riberi-Béridot, T., Tsoutsouva, M.G., Regula, G., Reinhart, G., Périchaud, I., Baruchel, J., Mangelinck-Noël, N.

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Nanometer-scale metal precipitates in multicrystalline silicon solar cells by McHugo, Scott A., Thompson, A. C., Mohammed, A., Lamble, G., Périchaud, I., Martinuzzi, S., Werner, M., Rinio, M., Koch, W., Hoefs, H.-U., Haessler, C.

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Nanometer-scale metal precipitates in multicrystalline siliconsolar cells by McHugo, Scott A., Thompson, A.C., Mohammed, A., Lamble, G., Perichaud, I., Martinuzzi, S., Werner, M., Rinio, M., Koch, W., Hoefs,H.-U., Haessler, C.

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From mc-Si material made by cold crucible continuous pulling to solar cells by Martinuzzi, S., Perichaud, I., Clerc, L., Bacon, M., Floret, F., Sarti, D., Dour, G., Quan Nam Le, Goaer, G., Durand, F.

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Degradation thermique des polystyrenes et du polychlorure de vinyle : Application d'une matrice d'expériences à l'etude de l'influence des paramètres de l'analyse thermomanométriqu... by MAGNIN, G, SERGENT, M, COEN, S, PERICHAUD, A, PHAN-TAN-LUU, R

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