Search Results - Petrovskaya, S.S.

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    Soft X-ray emission spectroscopy used for the characterization of a-C and CNx thin films

    Soft X-ray emission spectroscopy used for the characterization of a-C and CNx thin films by Nepijko, S.A., Chernenkaya, A., Medjanik, K., Chernov, S.V., Klimenkov, M., Vlasenko, O.V., Petrovskaya, S.S., Odnodvorets, L.V., Zaulichnyy, Ya.V., Schönhense, G.

    Published in Thin solid films
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