Search Results - Pflanzl, W.C.

  • Showing 1 - 5 results of 5
Refine Results
  1. 1
    Impact of hydrogen anneal on low frequency noise of n- and p-MOSFET

    Impact of hydrogen anneal on low frequency noise of n- and p-MOSFET by Ioannidis, E.G., Pflanzl, W.C., Stueckler, E., Vescoli, V., Carniello, S., Seebacher, E.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Impact of source/drain and bulk engineering on LFN performance of n- and p-MOSFET

    Impact of source/drain and bulk engineering on LFN performance of n- and p-MOSFET by Ioannidis, E.G., Rohracher, K., Roger, F., Pflanzl, W.C., Leisenberger, F.P., Wachmann, E., Seebacher, E., Vescoli, V.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    Investigation of Substrate Noise Coupling and Isolation Characteristics for a 0.35μM HV CMOS Technology

    Investigation of Substrate Noise Coupling and Isolation Characteristics for a 0.35μM HV CMOS Technology by Pflanzl, W.C., Seebacher, E.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  4. 4
    Poly resistor modeling over a wide range of geometries and their different temperature and voltage behaviour for a HV CMOS process

    Poly resistor modeling over a wide range of geometries and their different temperature and voltage behaviour for a HV CMOS process by Pflanzl, W.C., Seebacher, E.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  5. 5
    1/f noise corner modeling

    1/f noise corner modeling by Pflanzi, W.C., Seebacher, E., Huszka, Z.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: