Search Results - Phani, R.A.

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    X-ray reflectivity studies of very thin films of silicon oxide and silicon oxide–silicon nitride stacked structures

    X-ray reflectivity studies of very thin films of silicon oxide and silicon oxide–silicon nitride stacked structures by Santucci, S., la Cecilia, A.V., DiGiacomo, A., Phani, R.A., Lozzi, L.

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    High Resolution RP-HPLC Method for the Determination of Nevirapine and Associated Impurities

    High Resolution RP-HPLC Method for the Determination of Nevirapine and Associated Impurities by Phani, R. S, Prasad, K. R. S., Mallu, Useni

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