InGaAs composition monitoring for production MBE by in situ optical-based flux monitor (OFM) by Pinsukanjana, Paul R., Marquis, Jeremy M., Hubbard, Jared, Trivedi, Mehul A., Dickey, Roger F., Tsai, Jerry M.-S., Kuo, Sam P., Kao, Philip S., Kao, Yung-Chung

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Structural and optical characterization of infrared hot electron transistor by Jung, Hyeson, Pinsukanjana, Paul, Dutta, Mitra, Choi, Kwong-Kit, Tidrow, Meimei Z.

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Monitoring Ga and In desorption and In surface segregation during MBE using atomic absorption by Jackson, Andrew, Pinsukanjana, Paul, Coldren, Larry, Gossard, Arthur

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Noise, drift, and calibration in optical flux monitoring for MBE by W. Jackson, Andrew, Pinsukanjana, Paul R, Gossard, Arthur C, Coldren, Larry A

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In situ monitoring and control for MBE growth of optoelectronic devices by Jackson, A.W., Pinsukanjana, P.R., Gossard, A.C., Coldren, L.A.

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Implementation of integrated real-time multi-sensors on a multi-wafer production MBE system by Wang, Guang, Ren, Ge, Le, Luan, Lee, Henry P, Pinsukanjana, Paul, Hubbard, Jared, Kao, Yung-Chung

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Ultra low background InGaAs epi-layer on InP for PIN applications by production MBE by Xiaojun Jin, Pinsukanjana, P., Pepper, J., Gang He, Partyka, P., Minh Le, Haijun Zhu, Boehme, C., Barnes, B., Marquis, J., Thamban, P.L.S., Glosser, R., Jenn-Ming Kuo, Vargason, K., Yung-Chung Kao

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Implementation of integrated real-time multi-sensors on a multi-wafer production MBE system by GUANG WANG, GE REN, LUAN LE, LEE, Henry P, PINSUKANJANA, Paul, HUBBARD, Jared, KAO, Yung-Chung

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Monolithic Integration of Heterojunction Bipolar Transistor and Grating-Outcoupled Surface Emitting Laser Electronic-Photonic Integrated Circuit by Jones, W.A., McWilliams, S., Boehme, C., Haijun Zhu, Pinsukanjana, P., Masood, T., Linglin Jiang, Amarasinghe, V., Achtenhagen, M., Evans, G.A.

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