Extreme ultraviolet mask roughness effects in high numerical aperture lithography by Naulleau, Patrick, Wang, Yow-Gwo, Pistor, Tom

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Extreme ultraviolet mask defect simulation: Low-profile defects by Pistor, Tom, Deng, Yunfei, Neureuther, Andrew

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Extreme ultraviolet mask defect simulation by Pistor, Tom, Neureuther, Andrew

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Effects of multilayer mask roughness on extreme ultraviolet lithography by Deng, Yunfei, Pistor, Tom, Neureuther, Andrew R.

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A scuticociliate causes mass mortality of Diadema antillarum in the Caribbean Sea by Hewson, Ian, Ritchie, Isabella T, Evans, James S, Altera, Ashley, Behringer, Donald, Bowman, Erin, Brandt, Marilyn, Budd, Kayla A, Camacho, Ruleo A, Cornwell, Tomas O, Countway, Peter D, Croquer, Aldo, Delgado, Gabriel A, DeRito, Christopher, Duermit-Moreau, Elizabeth, Francis-Floyd, Ruth, Gittens, Jr, Samuel, Henderson, Leslie, Hylkema, Alwin, Kellogg, Christina A, Kiryu, Yasunari, Kitson-Walters, Kimani A, Kramer, Patricia, Lang, Judith C, Lessios, Harilaos, Liddy, Lauren, Marancik, David, Nimrod, Stephen, Patterson, Joshua T, Pistor, Marit, Romero, Isabel C, Sellares-Blasco, Rita, Sevier, Moriah L B, Sharp, William C, Souza, Matthew, Valdez-Trinidad, Andreina, van der Laan, Marijn, Vilanova-Cuevas, Brayan, Villalpando, Maria, Von Hoene, Sarah D, Warham, Matthew, Wijers, Tom, Williams, Stacey M, Work, Thierry M, Yanong, Roy P, Zambrano, Someira, Zimmermann, Alizee, Breitbart, Mya

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The role of law and legal institutions in Asian economic development, 1960-1995 by Pistor, Katharina, Wellons, Philip A, Ginsburg, Tom

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