Search Results - Poehle, Holger

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  1. 1
    Relevance of off-state NBTI degradation in depletion HVNMOS transistor for power application

    Relevance of off-state NBTI degradation in depletion HVNMOS transistor for power application by Strasser, Marc, Stradiotto, Roberta, Aresu, Stefano, Puschkarsky, Katja, Poehle, Holger, Gustin, Wolfgang

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    A study of fluorine implant in the formation of low leakage P+/N junction in BiCMOS technologies

    A study of fluorine implant in the formation of low leakage P+/N junction in BiCMOS technologies by Saad, Siti Zubaidah Md, Lik, T. C., Othman, M. A., Holger, P., Herman, S. H.

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    An improved P+/N diode leakage current in BiCMOS technologies with fluorine co-implant

    An improved P+/N diode leakage current in BiCMOS technologies with fluorine co-implant by Saad, S. Z. M., Tan Chan Lik, Othman, M. A., Holger, P., Herman, S. H.

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