Search Results - Poling, B.S.

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    Commercial-off-the-shelf algan/gan hemt device reliability study after exposure to heavy ion radiation

    Commercial-off-the-shelf algan/gan hemt device reliability study after exposure to heavy ion radiation by Poling, B.S., Via, G.D., Bole, K.D., Johnson, E.E., McDermott, J.M.

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  2. 2
    Performance of commercial foundry-level AlGaN/GaN HEMTs after hot electron stressing

    Performance of commercial foundry-level AlGaN/GaN HEMTs after hot electron stressing by Poling, B.S., Brown, J.L., Heller, E.R., Stumpff, B., Beckman, J.A., Hilton, A.M.

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