Search Results - Possin, G.E.

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  1. 1
    Temporal response of CZT detectors under intense irradiation

    Temporal response of CZT detectors under intense irradiation by Yanfeng Du, LeBlanc, J., Possin, G.E., Yanoff, B.D., Bogdanovich, S.

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  2. 2
    Measurements of the p-n product in heavily doped epitaxial emitters

    Measurements of the p-n product in heavily doped epitaxial emitters by Possin, G.E., Adler, M.S., Baliga, B.J.

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  3. 3
    VI-6 bit packing density of BEAMOS targets

    VI-6 bit packing density of BEAMOS targets by Possin, G.E.

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  4. 4
    Solution growth of silicon from liquid tin for application to photovoltaic solar cells

    Solution growth of silicon from liquid tin for application to photovoltaic solar cells by Possin, G.E.

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  5. 5
    Measurement of heavy doping parameters in silicon by electron-beam-induced current

    Measurement of heavy doping parameters in silicon by electron-beam-induced current by Possin, G.E., Adler, M.S., Baliga, B.J.

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  6. 6
    Achieving accuracy in transistor and thyristor modeling

    Achieving accuracy in transistor and thyristor modeling by Adler, M.S., Possin, G.E.

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  7. 7
    MOSFET's fabricated in laser-recrystallized Silicon on Quartz using selectively absorbing dielectrical layers

    MOSFET's fabricated in laser-recrystallized Silicon on Quartz using selectively absorbing dielectrical layers by Possin, G.E., Parks, H.G., Shin-Wu Chiang, Liu, Y.S.

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  8. 8
    Superconductivity in nearly one-dimensional tin wires

    Superconductivity in nearly one-dimensional tin wires by Possin, G.E.

    Published in Physica
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  9. 9
    Complex Radio-Frequency Impedance of Type-II Superconductors

    Complex Radio-Frequency Impedance of Type-II Superconductors by Possin, George E., Shepard, Kenneth W.

    Published in Physical review
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  10. 10
    A semiconductor nonvolatile electron beam accessed mass memory

    A semiconductor nonvolatile electron beam accessed mass memory by Hughes, W.C., Lemmond, C.Q., Parks, H.G., Ellis, G.W., Possin, G.E., Wilson, R.H.

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