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PCB pin-field considerations for 40 Gb/s SerDes channels
by
Degerstrom, Michael J.
,
Post, Devon J.
,
Gilbert, Barry K.
,
Daniel, Erik S.
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Non-TMR SEU-hardening techniques for SiGe HBT shift registers and clock buffers
by
Wilcox, E. P.
,
Phillips, S. D.
,
Cressler, J. D.
,
Marshall, P. W.
,
Carts, M. A.
,
Pellish, J. A.
,
Richmond, L.
,
Mathes, W.
,
Randall, B.
,
Post, D.
,
Gilbert, B.
,
Daniel, E.
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Bit Error Rate Testing
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Dielectrics
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Engineering
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Engineering, Electrical & Electronic
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Gated Feedback Cell
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Insertion Loss
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Permittivity
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Permittivity Measurement
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Radiation Hardening By Design
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Science & Technology
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Silicon-Germanium
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Single Event Upset
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Sockets
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Stripline
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Technology
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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