Search Results - Potera, Rahul

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  1. 1
    Characterization of Early Breakdown of SiC MOSFET Gate Oxide by Voltage Ramp Tests

    Characterization of Early Breakdown of SiC MOSFET Gate Oxide by Voltage Ramp Tests by Zheng, Yongju, Potera, Rahul, Witt, Tony

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    Improvements to the Analytical Model to Describe UIS Events

    Improvements to the Analytical Model to Describe UIS Events by Steinmann, Philipp, Ganguly, Satyaki, Hull, Brett, Lam, Khiem, Lichtenwalner, Daniel J., Park, Jae-Hyung, Potera, Rahul, Richmond, Jim, Ryu, Sei-Hyung, Sabri, Shadi, Van Brackle, Charles, Van Brunt, Edward, Williams, Elizabeth

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    Silicon Carbide Diodes in Power-Factor Correction Circuits: Device and Circuit Design Aspects

    Silicon Carbide Diodes in Power-Factor Correction Circuits: Device and Circuit Design Aspects by Potera, Rahul Radhakrishnan, Han, Timothy Junghee

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