Search Results - Praba Drijarkara, A

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  1. 1
    Bi-lateral comparison APMP.L-K5.2006.1—calibration of step gauge

    Bi-lateral comparison APMP.L-K5.2006.1—calibration of step gauge by Abe, Makoto, Drijarkara, A Praba, Babu, Virendra

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  2. 2
    Final report on APMP supplementary comparison APMP.L-S3: Calibration of gauge blocks by mechanical comparison

    Final report on APMP supplementary comparison APMP.L-S3: Calibration of gauge blocks by mechanical comparison by Praba Drijarkara, A

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  3. 3
    Final report on APMP supplementary comparison APMP.L-S3: Calibration of gauge blocks by mechanical comparison

    Final report on APMP supplementary comparison APMP.L-S3: Calibration of gauge blocks by mechanical comparison by Drijarkara, A Praba, Kang, Chu-Shik

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  4. 4
    Final report on APMP Regional Comparison APMP.L-K5: Calibration of step gauge

    Final report on APMP Regional Comparison APMP.L-K5: Calibration of step gauge by Eom, Taebong, Sitian, Gao, Wong, S Y, Chaudhary, K P, Drijarkara, A Praba, Howick, Eleanor, Tonmeanwai, Anusom, Pan, Shan-Peng, Takatsuji, Toshiyuki, Cox, Peter, Thalmann, Rudolf, Alves, João Antônio Pires, Stoup, John

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  5. 5
    Final report on APMP Regional Comparison APMP.L-K5: Calibration of step gauge

    Final report on APMP Regional Comparison APMP.L-K5: Calibration of step gauge by Eom, Taebong, Sitian, Gao, Wong, S Y, Chaudhary, K P, Praba Drijarkara, A, Howick, Eleanor, Tonmeanwai, Anusom, Pan, Shan-Peng, Takatsuji, Toshiyuki, Cox, Peter, Thalmann, Rudolf, Pires Alves, João Antônio, Stoup, John

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  6. 6
    The development software used for surface plate calibration in national standardization agency of Indonesia

    The development software used for surface plate calibration in national standardization agency of Indonesia by Novyanto, Okasatria, Drijarkara, Agustinus Praba, Azzumar, Muhammad, Istiqomah, Istiqomah, Rahman, Ardi, Alfiyati, Nurul, Hapiddin, Asep

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  7. 7
    Uncertainty evaluation of thickness and warp of a silicon wafer measured by a spectrally resolved interferometer

    Uncertainty evaluation of thickness and warp of a silicon wafer measured by a spectrally resolved interferometer by Drijarkara, Agustinus Praba, Gebrie, Tadesse Gergiso, Lee, Jae Yong, Kang, Chu-Shik

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  8. 8
    High Resolution SelfA Rotary Table by the Interpolation Signal Calibration

    High Resolution SelfA Rotary Table by the Interpolation Signal Calibration by Vatcharanukul, Ketsaya, Samit, Watcharin, Drijarkara, Agustinus Praba, Watanabe, Tsukasa, Tonmueanwai, Anusorn

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