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Advanced TCAD Simulation of Silver Sintering for Power Modules Integration
by
Pribitny, P.
,
Chvala, A.
,
Marek, J.
,
Donoval, D.
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Degradation of the low voltage power MOSFET electrical parameters during multipulse UIS test
by
Marek, J.
,
Donoval, D.
,
Petrus, M.
,
Stuchlikova, O.
,
Chvala, A.
,
Molnar, M.
,
Pribitny, P.
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Analytical Models
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Capacitance
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Degradation
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Engineering
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Engineering, Electrical & Electronic
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Logic Gates
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Multichip Modules
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Physics, Applied
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Reliability
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Science & Technology
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Science & Technology - Other Topics
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Semiconductor Device Measurement
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Silver
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Solid Modeling
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Switching Circuits
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Technology
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Thermal Analysis
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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