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Circuit relevant HCS lifetime assessments at single transistors with emulated variable loads
by
Schlunder, Christian
,
Proebster, F.
,
Berthold, J.
,
Puschkarsky, Katja
,
Georgakos, Georg
,
Gustin, Wolfgang
,
Reisinger, Hans
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Chairmen's preface
by
Hagedorn, F.
,
Proebster, W.
Published in
IEEE transactions on magnetics
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Articles
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Conference Proceedings
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Journal Title
Ieee Transactions On Magnetics
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Subjects
Degradation
1 results
1
Engineering
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1
Engineering, Electrical & Electronic
1 results
1
Inverters
1 results
1
Logic Gates
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1
Negative Bias Temperature Instability
1 results
1
Science & Technology
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1
Stress
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1
Technology
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1
Thermal Variables Control
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Transistors
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Year of Publication
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1400 : 2026
1400
2026
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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Ieee Electronic Library (Iel) Journals
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Ieee Xplore All Journals
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