Search Results - Pshenova, Alisa S.

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  1. 1
    Luminescence Enhancement and SERS by Self-Assembled Plasmonic Silver Nanostructures in Nanoporous Glasses

    Luminescence Enhancement and SERS by Self-Assembled Plasmonic Silver Nanostructures in Nanoporous Glasses by Pshenova, Alisa S., Sidorov, Alexander I., Antropova, Tatiana V., Nashchekin, Aleksey V.

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  2. 2
    Formation of luminescent and nonluminescent silver nanoparticles in silicate glasses by near-infrared femtosecond laser pulses and subsequent thermal treatment: the role of halogenides

    Formation of luminescent and nonluminescent silver nanoparticles in silicate glasses by near-infrared femtosecond laser pulses and subsequent thermal treatment: the role of halogen... by Klyukin, Dmitry A, Dubrovin, Victor D, Pshenova, Alisa S, Putilin, Sergey E, Shakhverdov, Teimur A, Tsypkin, Anton N, Nikonorov, Nikolay V, Sidorov, Alexander I

    Published in Optical engineering
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  3. 3
    Analysis of hydrogen distribution and migration in fired passivating contacts (FPC)

    Analysis of hydrogen distribution and migration in fired passivating contacts (FPC) by Lehmann, Mario, Valle, Nathalie, Horzel, Jörg, Pshenova, Alisa, Wyss, Philippe, Döbeli, Max, Despeisse, Matthieu, Eswara, Santhana, Wirtz, Tom, Jeangros, Quentin, Hessler-Wyser, Aïcha, Haug, Franz-Josef, Ingenito, Andrea, Ballif, Christophe

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  4. 4
    Correlative electron and ion beam analysis of the electrochemical performances of LiV3O8 cathode films as a function of microstructures

    Correlative electron and ion beam analysis of the electrochemical performances of LiV3O8 cathode films as a function of microstructures by Sarbada, Varun, Yedra, Lluís, Pshenova, Alisa, Kercher, Andrew, Marschilok, Amy, Takeuchi, Kenneth J., Takeuchi, Esther, Dudney, Nancy, Wirtz, Tom, Eswara, Santhana, Hull, Robert

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  5. 5
    A correlative method to quantitatively image trace concentrations of elements by combined SIMS-EDX analysis

    A correlative method to quantitatively image trace concentrations of elements by combined SIMS-EDX analysis by Yedra, Lluís, Shyam Kumar, C. N, Pshenova, Alisa, Lentzen, Esther, Philipp, Patrick, Wirtz, Tom, Eswara, Santhana

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  6. 6
    In Situ Correlative Microscopy Combining Transmission Electron Microscopy and Secondary Ion Mass Spectrometry

    In Situ Correlative Microscopy Combining Transmission Electron Microscopy and Secondary Ion Mass Spectrometry by Eswara, Santhana, Yedra, Lluis, Pshenova, Alisa, Sarbada, Varun, Audinot, Jean-Nicolas, Hull, Robert, Wirtz, Tom

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  7. 7
    A method for quantitative nanoscale imaging of dopant distributions using secondary ion mass spectrometry: an application example in silicon photovoltaics

    A method for quantitative nanoscale imaging of dopant distributions using secondary ion mass spectrometry: an application example in silicon photovoltaics by Eswara, Santhana, Pshenova, Alisa, Lentzen, Esther, Nogay, Gizem, Lehmann, Mario, Ingenito, Andrea, Jeangros, Quentin, Haug, Franz-Josef, Valle, Nathalie, Philipp, Patrick, Hessler-Wyser, Aïcha, Wirtz, Tom

    Published in MRS communications
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  8. 8
    Analysis of hydrogen distribution and migration in fired passivating contacts (FPC)

    Analysis of hydrogen distribution and migration in fired passivating contacts (FPC) by Lehmann, Mario, Valle, Nathalie, Horzel, Jörg, Pshenova, Alisa, Wyss, Philippe, Döbeli, Max, Despeisse, Matthieu, Eswara, Santhana, Wirtz, Tom, Jeangros, Quentin, Hessler-Wyser, Aïcha, Haug, Franz-Josef, Ingenito, Andrea, Ballif, Christophe

    Published in arXiv.org
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