Search Results - Pyo, Suksoo

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  1. 1
    Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM

    Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM by Chang, Daehyun, Kim, Youngdae, Pyo, Suksoo, Hun, Shin, Lee, Daesop, Hwang, Sohee, Choi, Jaesik, Kim, Siwoong

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    A 14.7Mb/mm2 28nm FDSOI STT-MRAM with Current Starved Read Path, 52Ω/Sigma Offset Voltage Sense Amplifier and Fully Trimmable CTAT Reference

    A 14.7Mb/mm2 28nm FDSOI STT-MRAM with Current Starved Read Path, 52Ω/Sigma Offset Voltage Sense Amplifier and Fully Trimmable CTAT Reference by Boujamaa, El Mehdi, Ali, Samsudeen Mohamed, Wandji, Steve Ngueya, Gourio, Alexandra, Pyo, Suksoo, Koh, Gwanhyeob, Song, Yoonjong, Song, Taejoong, Kye, Jongwook, Vial, Jean Christophe, Sowden, Andrew, Rathor, Manuj, Dray, Cyrille

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