Search Results - Qianwei Zhou

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  1. 161
    A novel model of photo-carrier screening effect on the GaN-based p-i-n ultraviolet detector

    A novel model of photo-carrier screening effect on the GaN-based p-i-n ultraviolet detector by Gao, Bo, Liu, HongXia, Kuang, QianWei, Zhou, Wen, Cao, Lei

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  2. 162
    The Effect of Chronic Prostatitis/Chronic Pelvic Pain Syndrome (CP/CPPS) on Semen Parameters in Human Males: A Systematic Review and Meta-Analysis: e94991

    The Effect of Chronic Prostatitis/Chronic Pelvic Pain Syndrome (CP/CPPS) on Semen Parameters in Human Males: A Systematic Review and Meta-Analysis: e94991 by Fu, Weihua, Zhou, Zhansong, Liu, Shijian, Li, Qianwei, Yao, Jiwei, Li, Weibing, Yan, Junan

    Published in PloS one
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  3. 163
    Defect detection of IC wafer based on two-dimension wavelet transform

    Defect detection of IC wafer based on two-dimension wavelet transform by Liu, Hongxia, Zhou, Wen, Kuang, Qianwei, Cao, Lei, Gao, Bo

    Published in Microelectronics
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  4. 164
    Vision-Based Interface: Using Face and Eye Blinking Tracking with Camera

    Vision-Based Interface: Using Face and Eye Blinking Tracking with Camera by Zhu Hao, Qianwei Lei

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  5. 165
    Defects detecting method of copper interconnects based on signal reflection theory

    Defects detecting method of copper interconnects based on signal reflection theory by Wen Zhou, Hongxia Liu, Jianjun Wei, Qianwei Kuang

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  6. 166
    Photo-generated parasitical capacitance model of GaN-based pin ultraviolet detector

    Photo-generated parasitical capacitance model of GaN-based pin ultraviolet detector by Bo Gao, Hongxia Liu, Qianwei Kuang, Wen Zhou, Lei Cao

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  7. 167
    Transport mechanism of the leakage current in MIS capacitor with HfO2/SiO2 stack gate

    Transport mechanism of the leakage current in MIS capacitor with HfO2/SiO2 stack gate by Qianwei Kuang, Hongxia Liu, Wen Zhou, Bo Gao, Zhao, A., Tallavarjula, S.

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  8. 168
    Physical and structural properties of HfO2/SiO2 gate stack high-k dielectrics deposited by atomic layer deposition

    Physical and structural properties of HfO2/SiO2 gate stack high-k dielectrics deposited by atomic layer deposition by Zhou Tao, Liu Hongxia, Kuang Qianwei, Cai Naiqiong, Hao Yue, Aaron, Z., Sai, T.

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