Ultra-Low Emissivity Alpha-Particle Detection by Gordon, M. S., Rodbell, K. P., Tang, H. H. K., Ronsheim, P., Zhu, Z., Rauch, S. E., McNally, B. D., Coleman, S.

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Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies by La Rosa, Giuseppe, Rauch, Stewart E.

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Impact of E-E scattering to the hot carrier degradation of deep submicron NMOSFETs by Rauch, S.E., Guarin, F.J., LaRosa, G.

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Hot-Carrier Degradation Modeling of Decananometer nMOSFETs Using the Drift-Diffusion Approach by Sharma, Prateek, Tyaginov, Stanislav, Rauch, Stewart E., Franco, Jacopo, Makarov, Alexander, Vexler, Mikhail I., Kaczer, Ben, Grasser, Tibor

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Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM by Heidel, D.F., Marshall, P.W., Pellish, J.A., Rodbell, K.P., LaBel, K.A., Schwank, J.R., Rauch, S.E., Hakey, M.C., Berg, M.D., Castaneda, C.M., Dodd, P.E., Friendlich, M.R., Phan, A.D., Seidleck, C.M., Shaneyfelt, M.R., Xapsos, M.A.

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A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs by Sharma, Prateek, Tyaginov, Stanislav, Rauch, Stewart E., Franco, Jacopo, Kaczer, Ben, Makarov, Alexander, Vexler, Mikhail I., Grasser, Tibor

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Outstanding Conference Paper Award 2009 IEEE Nuclear and Space Radiation Effects Conference

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The energy driven paradigm of NMOSFET hot carrier effects by Rauch, S.E., La Rosa, G.

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Review and Reexamination of Reliability Effects Related to NBTI-Induced Statistical Variations by Rauch, S.E.

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Improvement in hot carrier lifetime as a function of N sub(2) ion implantation before gate oxide growth in deep submicron NMOS devices by Guarin, Fernando J, Rauch, Stewart E I I I, La Rosa, Giuseppe, Brelsford, Kevin

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Role of E-E scattering in the enhancement of channel hot carrier degradation of deep-submicron NMOSFETs at high VGS conditions by RAUCH, Stewart E, LA ROSA, Giuseppe, GUARIN, Fernando J

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The statistics of NBTI-induced VT and β mismatch shifts in pMOSFETs by RAUCH, Stewart E

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The statistics of NBTI-induced V/T/ and /beta/ mismatch shifts in pMOSFETs by Rauch, S E

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The energy-driven paradigm of NMOSFET hot-carrier effects by Rauch, S.E., La Rosa, G.

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High-[Formula Omitted] PFET DC Hot-Carrier Mechanism and Its Relation to AC Degradation by Rauch, Stewart E, Guarin, Fernando, La Rosa, Giuseppe

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High- V rm GS PFET DC Hot-Carrier Mechanism and Its Relation to AC Degradation by Rauch, Stewart E, Guarin, Fernando, La Rosa, Giuseppe

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Revealing the complex genetic architecture of obsessive–compulsive disorder using meta-analysis by Arnold, Paul D, Askland, Kathleen D, Barlassina, Cristina, Bellodi, Laura, Bienvenu, O J, Black, Donald, Bloch, Michael, Brentani, Helena, Burton, Christie L, Camarena, Beatriz, Cappi, Carolina, Cath, Danielle, Cavallini, Maria, Conti, David, Cook, Edwin, Coric, Vladimir, Cullen, Bernadette A, Cusi, Danielle, Davis, Lea K, Delorme, Richard, Denys, Damiaan, Derks, Eske, Eapen, Valsamma, Edlund, Christopher, Erdman, Lauren, Falkai, Peter, Figee, Ma, Fyer, Abigail J, Geller, Daniel A, Goes, Fernando S, Grabe, Hans, Grados, Marcos A, Greenberg, Benjamin D, Grünblatt, Edna, Guo, Wei, Hanna, Gregory L, Hemmings, Sian, Hounie, Ana G, Jenicke, Michael, Keenan, Clare, Kennedy, James, Khramtsova, Ekaterina A, Konkashbaev, Anuar, Knowles, James A, Krasnow, Janice, Lange, Cristophe, Lanzagorta, Nuria, Leboyer, Marion, Lennertz, Leonhard, Li, Bingbin, Liang, K-Y, Lochner, Christine, Macciardi, Fabio, Maher, Brion, Maier, Wolfgang, Marconi, Maurizio, Mathews, Carol A, Matthesien, Manuel, McCracken, James T, McLaughlin, Nicole C, Miguel, Euripedes C, Moessner, Rainald, Murphy, Dennis L, Neale, Benjamin, Nestadt, Gerald, Nestadt, Paul, Nicolini, Humberto, Nurmi, Ericka, Osiecki, Lisa, Pauls, David L, Piacentini, John, Posthuma, Danielle, Pulver, Ann E, Qin, H-D, Rasmussen, Steven A, Rauch, Scott, Richter, Margaret A, Riddle, Mark A, Ripke, Stephan, Ruhrmann, Stephan, Sampaio, Aline S, Samuels, Jack F, Scharf, Jeremiah M, Shugart, Yin Yao, Smit, Jan, Stein, Daniel, Stewart, S Evelyn, Turiel, Maurizio, Vallada, Homero, Veenstra-VanderWeele, Jeremy, Wagner, Michael, Walitza, Susanne, Wang, Y, Wendland, Jens, Vulink, Nienke, Yu, Dongmei, Zai, Gwyneth

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Meta-analysis of association between obsessive-compulsive disorder and the 3′ region of neuronal glutamate transporter gene SLC1A1 by Stewart, S.E., Mayerfeld, C., Arnold, P.D., Crane, J.R., O'Dushlaine, C., Fagerness, J.A., Yu, D., Scharf, J.M., Chan, E., Kassam, F., Moya, P.R., Wendland, J.R., Delorme, R., Richter, M.A., Kennedy, J.L., Veenstra-VanderWeele, J., Samuels, J., Greenberg, B.D., McCracken, J.T., Knowles, J.A., Fyer, A.J., Rauch, S.L., Riddle, M.A., Grados, M.A., Bienvenu, O.J., Cullen, B., Wang, Y., Shugart, Y.Y., Piacentini, J., Rasmussen, S., Nestadt, G., Murphy, D.L., Jenike, M.A., Cook, E.H., Pauls, D.L., Hanna, G.L., Mathews, C.A.

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Partitioning the heritability of Tourette syndrome and obsessive compulsive disorder reveals differences in genetic architecture by Davis, Lea K, Yu, Dongmei, Keenan, Clare L, Gamazon, Eric R, Konkashbaev, Anuar I, Derks, Eske M, Neale, Benjamin M, Yang, Jian, Lee, S Hong, Evans, Patrick, Barr, Cathy L, Bellodi, Laura, Benarroch, Fortu, Berrio, Gabriel Bedoya, Bienvenu, Oscar J, Bloch, Michael H, Blom, Rianne M, Bruun, Ruth D, Budman, Cathy L, Camarena, Beatriz, Campbell, Desmond, Cappi, Carolina, Cardona Silgado, Julio C, Cath, Danielle C, Cavallini, Maria C, Chavira, Denise A, Chouinard, Sylvain, Conti, David V, Cook, Edwin H, Coric, Vladimir, Cullen, Bernadette A, Deforce, Dieter, Delorme, Richard, Dion, Yves, Edlund, Christopher K, Egberts, Karin, Falkai, Peter, Fernandez, Thomas V, Gallagher, Patience J, Garrido, Helena, Geller, Daniel, Girard, Simon L, Grabe, Hans J, Grados, Marco A, Greenberg, Benjamin D, Gross-Tsur, Varda, Haddad, Stephen, Heiman, Gary A, Hemmings, Sian M J, Hounie, Ana G, Illmann, Cornelia, Jankovic, Joseph, Jenike, Michael A, Kennedy, James L, King, Robert A, Kremeyer, Barbara, Kurlan, Roger, Lanzagorta, Nuria, Leboyer, Marion, Leckman, James F, Lennertz, Leonhard, Liu, Chunyu, Lochner, Christine, Lowe, Thomas L, Macciardi, Fabio, McCracken, James T, McGrath, Lauren M, Mesa Restrepo, Sandra C, Moessner, Rainald, Morgan, Jubel, Muller, Heike, Murphy, Dennis L, Naarden, Allan L, Ochoa, William Cornejo, Ophoff, Roel A, Osiecki, Lisa, Pakstis, Andrew J, Pato, Michele T, Pato, Carlos N, Piacentini, John, Pittenger, Christopher, Pollak, Yehuda, Rauch, Scott L, Renner, Tobias J, Reus, Victor I, Richter, Margaret A, Riddle, Mark A, Robertson, Mary M, Romero, Roxana, Rosàrio, Maria C, Rosenberg, David, Rouleau, Guy A, Ruhrmann, Stephan, Ruiz-Linares, Andres, Sampaio, Aline S, Samuels, Jack, Sandor, Paul, Sheppard, Brooke, Singer, Harvey S, Smit, Jan H

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Unsuccessful Direct Acting Antiviral Hepatitis C Treatment Among People With HIV: Findings From an International Cohort by Harney, Brendan L., Sacks‐Davis, Rachel, Santen, Daniela K., Stewart, Ashleigh C., Matthews, Gail V., Carson, Joanne M., Klein, Marina B., Lacombe, Karine, Wittkop, Linda, Salmon, Dominque, Leleux, Olivier, Merchadou, Laurence, Valk, Marc, Smit, Colette, Prins, Maria, Boyd, Anders, Berenguer, Juan, Jarrin, Inmaculada, Rauch, Andri, Hellard, Margaret E., Doyle, Joseph S.

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