Design and characterization of dielectric filled TM110 microwave cavities for ultrafast electron microscopy by Verhoeven, W., van Rens, J. F. M., Kemper, A. H., Rietman, E. H., van Doorn, H. A., Koole, I., Kieft, E. R., Mutsaers, P. H. A., Luiten, O. J.

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A nonlinear system model for electrospinning sub-100 nm polyacrylonitrile fibres by Costolo, M A, Lennhoff, J D, Pawle, R, Rietman, E A, Stevens, A E

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The Effect of Frequency Sweeping and Fluid Flow on Particle Trajectories in Ultrasonic Standing Waves by Lipkens, B., Costolo, M., Rietman, E.

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Bulk superconductivity at 36 K in La1.8Sr0.2CuO4 by CAVA, R. J, VAN DOVER, R. B, BATLOGG, B, RIETMAN, E. A

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A study on failure prediction in a plasma reactor by Rietman, E.A., Beachy, M.

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Evolving oscillators in silico by Huelsbergen, L., Rietman, E., Slous, R.

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Isotope effect in the high-Tc superconductors Ba2YCu3O7 and Ba2EuCu3O7 by BATLOGG, B, CAVA, R. J, SHORT, K. T, MUJSCE, A. M, RIETMAN, E. A, JAYARAMAN, A, VAN DOVER, R. B, KOUROUKLIS, G. A, SUNSHINE, S, MURPHY, D. W, RUPP, L. W, CHEN, H. S, WHITE, A

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Use of neural networks in modeling semiconductor manufacturing processes: an example for plasma etch modeling by Rietman, E., Lory, E.R.

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A neural network model of a contact plasma etch process for VLSI production by Rietman, E.A.

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Bulk superconductivity at 91 K in single-phase oxygen-deficient perovskite Ba2YCu3O9-δ by CAVA, R. J, BATLOGG, B, VAN DOVER, R. B, MURPHY, D. W, SUNSHINE, S, SIEGRIST, T, REMEIKA, J. P, RIETMAN, E. A, ZAHURAK, S, ESPINOSA, G. P

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Nonzero isotope effect in La1.85Sr0.15CuO4 by BATLOGG, B, KOUROUKLIS, G, WEBER, W, CAVA, R. J, JAYARAMAN, A, WHITE, A. E, SHORT, K. T, RUPP, L. W, RIETMAN, E. A

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Oxygen stoichiometry, superconductivity and normal-state properties of YBa2Cu3O7–δ by Cava, R. J., Batlogg, B., Chen, C. H., Rietman, E. A., Zahurak, S. M., Werder, D.

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Lithium ion-poly (ethylene oxide) complexes. I. Effect of anion on conductivity by Rietman, E.A, Kaplan, M.L, Cava, R.J

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Design and characterization of dielectric filled TM 110 microwave cavities for ultrafast electron microscopy by Verhoeven, W, van Rens, J F M, Kemper, A H, Rietman, E H, van Doorn, H A, Koole, I, Kieft, E R, Mutsaers, P H A, Luiten, O J

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Design and characterization of dielectric filled TM\(_{110}\) microwave cavities for ultrafast electron microscopy by Verhoeven, W, J F M van Rens, Kemper, A H, Rietman, E H, van Doorn, H A, Koole, I, Kieft, E R, Mutsaers, P H A, Luiten, O J

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Evidence for a Peierls distortion in La2CuO4 from vibrational spectroscopy by STAVOLA, M, CAVA, R. J, RIETMAN, E. A

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A new algorithm for real-time thin film thickness estimation given in situ multiwavelength ellipsometry using an extended Kalman filter by Galarza, C.G., Khargonekar, P.P., Layadi, N., Vincent, T.L., Rietman, E.A., Lee, J.T.C.

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A system model for feedback control and analysis of yield: A multistep process model of effective gate length, poly line width, and IV parameters by Rietman, E.A., Whitlock, S.A., Beachy, M., Roy, A., Willingham, T.L.

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Structural anomalies at the disappearance of superconductivity in Ba2YCu3O7−δ: Evidence for charge transfer from chains to planes by Cava, R.J., Batlogg, B., Rabe, K.M., Rietman, E.A., Gallagher, P.K., Rupp, L.W.

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A genetic algorithm for low variance control in semiconductor device manufacturing: some early results by Rietman, E.A., Frye, R.C.

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