Search Results - ROSTAM-KHANI, P

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  1. 1
    Quantitative analysis of surface contaminants on silicon wafers by means of TOF-SIMS

    Quantitative analysis of surface contaminants on silicon wafers by means of TOF-SIMS by Rostam-Khani, P., Philipsen, J., Jansen, E., Eberhard, H., Vullings, P.

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  2. 2
    Quantification issues of trace metal contaminants on silicon wafers by means of TOF-SIMS, ICP-MS, and TXRF

    Quantification issues of trace metal contaminants on silicon wafers by means of TOF-SIMS, ICP-MS, and TXRF by Rostam-Khani, P., Hopstaken, M.J.P., Vullings, P., Noij, G., O’Halloran, O., Claassen, W.

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  3. 3
    Calibration of straight total reflection X-ray fluorescence spectrometry — results of a European Round Robin test

    Calibration of straight total reflection X-ray fluorescence spectrometry — results of a European Round Robin test by Rink, I., Rostam-Khani, P., Knoth, J., Schwenke, H., de Gendt, S., Wortelboer, R.

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  4. 4
    Total-reflection X-ray fluorescence study of electrochemical deposition of metals on a glass-ceramic carbon electrode surface

    Total-reflection X-ray fluorescence study of electrochemical deposition of metals on a glass-ceramic carbon electrode surface by Alov, N.V, Oskolok, K.V, Wittershagen, A, Mertens, M, Rittmeyer, C, Rostam-Khani, P, Kolbesen, B.O

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  5. 5
    Trace element determination in drugs by total-reflection X-ray fluorescence spectrometry

    Trace element determination in drugs by total-reflection X-ray fluorescence spectrometry by Wagner, M., Rostam-Khani, P., Wittershagen, A., Rittmeyer, Claudia, Kolbesen, B.O., Hoffmann, H.

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  6. 6
    Determination of metal-cofactors in enzyme complexes by total-reflection X-ray fluorescence spectrometry

    Determination of metal-cofactors in enzyme complexes by total-reflection X-ray fluorescence spectrometry by Wittershagen, A., Rostam-Khani, P., Klimmek, O., Groß, R., Zickermann, V., Zickermann, I., Gemeinhardt, S., Kröger, A., Ludwig, B., Kolbesen, B.O.

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  7. 7
    Study of CMOS-compatible Copper Etching for Organic Coating

    Study of CMOS-compatible Copper Etching for Organic Coating by Lambert, Magali, Rostam-Khani, Patrick, Ten Veen, Jacoline, Van Nimwegen, Leon, Frederix, Filip

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  8. 8
    Total-reflection X-ray fluorescence spectrometry, a powerful tool for semiquantitative analysis of archaeological glass samples

    Total-reflection X-ray fluorescence spectrometry, a powerful tool for semiquantitative analysis of archaeological glass samples by Wegstein, M, Urban, H, Rostam-Khani, P, Wittershagen, A, Kolbesen, B.O

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  9. 9
    Determination of metal-cofactors in respiratory chain complexes by total-reflection X-ray fluorescence spectrometry (TXRF)

    Determination of metal-cofactors in respiratory chain complexes by total-reflection X-ray fluorescence spectrometry (TXRF) by WITTERSHAGEN, A, ROSTAM-KHANI, P, ZICKERMANN, V, ZICKERMANN, I, GEMEINHARDT, S, LUDWIG, B, KOLBESEN, B. O

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  10. 10
    Quantification issues of trace metal contaminants on silicon wafers by means of TOF-SIMS, ICP-MS, and TXRF

    Quantification issues of trace metal contaminants on silicon wafers by means of TOF-SIMS, ICP-MS, and TXRF by ROSTAM-KHANI, P, HOPSTAKEN, M. J. P, VULLINGS, P, NOIJ, G, O'HALLORAN, O, CLAASSEN, W

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