Search Results - Randriamazaoro, R. N.

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    Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response

    Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response by Geandier, G., Thiaudière, D., Randriamazaoro, R. N., Chiron, R., Djaziri, S., Lamongie, B., Diot, Y., Le Bourhis, E., Renault, P. O., Goudeau, P., Bouaffad, A., Castelnau, O., Faurie, D., Hild, F.

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  2. 2
    Mechanical characterization of nanostructured thin films at different scales

    Mechanical characterization of nanostructured thin films at different scales by Brémand, Fabrice, Djaziri, S., Thiaudière, D., Geandier, G., Renault, P.O., Le Bourhis, E., Goudeau, P., Randriamazaoro, R.N., Chiron, R., Castelnau, O., Faurie, D., Hild, F.

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