Search Results - Rauch, SE III

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  1. 1
    Improvement in hot carrier lifetime as a function of N sub(2) ion implantation before gate oxide growth in deep submicron NMOS devices

    Improvement in hot carrier lifetime as a function of N sub(2) ion implantation before gate oxide growth in deep submicron NMOS devices by Guarin, Fernando J, Rauch, Stewart E I I I, La Rosa, Giuseppe, Brelsford, Kevin

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  2. 2
    The statistics of NBTI-induced V sub(T) and beta mismatch shifts in pMOSFETs

    The statistics of NBTI-induced V sub(T) and beta mismatch shifts in pMOSFETs by Rauch, SE III

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  3. 3
    Role of E-E scattering in the enhancement of channel hot carrier degradation of deep-submicron NMOSFETs at high V sub(GS) conditions

    Role of E-E scattering in the enhancement of channel hot carrier degradation of deep-submicron NMOSFETs at high V sub(GS) conditions by Rauch, SE III, La Rosa, G, Guarin, F J

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    The energy-driven paradigm of NMOSFET hot-carrier effects

    The energy-driven paradigm of NMOSFET hot-carrier effects by Rauch, S.E., La Rosa, G.

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