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Circuit-Level Impact of a-Si:H Thin-Film-Transistor Degradation Effects
by
Allee, D.R.
,
Clark, L.T.
,
Vogt, B.D.
,
Shringarpure, R.
,
Venugopal, S.M.
,
Uppili, S.G.
,
Kaftanoglu, K.
,
Shivalingaiah, H.
,
Li, Z.P.
,
Ravindra Fernando, J.J.
,
Bawolek, E.J.
,
O'Rourke, S.M.
Published in
IEEE transactions on electron devices
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Ieee Transactions On Electron Devices
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Amorphous Silicon
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