DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies by Howell, W., Hapke, F., Brazil, E., Venkataraman, S., Datta, R., Glowatz, A., Redemund, W., Schmerberg, J., Fast, A., Rajski, J.

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Defect-oriented cell-internal testing by Hapke, F, Redemund, W, Schloeffel, J, Krenz-Baath, R, Glowatz, A, Wittke, M, Hashempour, H, Eichenberger, S

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Cell-aware analysis for small-delay effects and production test results from different fault models by Hapke, F., Schloeffel, J., Redemund, W., Glowatz, A., Rajski, J., Reese, M., Rearick, J., Rivers, J.

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Cell-aware Production test results from a 32-nm notebook processor by Hapke, F., Reese, M., Rivers, J., Over, A., Ravikumar, V., Redemund, W., Glowatz, A., Schloeffel, J., Rajski, J.

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Cell-aware experiences in a high-quality automotive test suite by Hapke, F., Arnold, R., Beck, M., Baby, M., Straehle, S., Goncalves, J. F., Panait, A., Behr, R., Maugard, G., Prashanthi, A., Schloeffel, J., Redemund, W., Glowatz, A., Fast, A., Rajski, J.

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