Search Results - Regache, M.

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    Investigation and modeling of the electrical properties of metal–oxide–metal structures formed from chemical vapor deposited Ta2O5 films

    Investigation and modeling of the electrical properties of metal–oxide–metal structures formed from chemical vapor deposited Ta2O5 films by Blonkowski, S., Regache, M., Halimaoui, A.

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  2. 2
    Non-linear dielectric properties of metal–amorphous-tantalum pentoxide–metal structures

    Non-linear dielectric properties of metal–amorphous-tantalum pentoxide–metal structures by Blonkowski, S., Regache, M., Halimaoui, A.

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    Buckling pattern with rings: Evidence of plastic damage in thin films

    Buckling pattern with rings: Evidence of plastic damage in thin films by Coupeau, C., George, M., Regache, I., Colin, J., Grilhé, J.

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